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Alidzhanov E.k., Domakhin O.A., Letuta S.N., Bespalov V.A., Loginov B.A. VACUUM SCANNING TUNNEL MICROSCOPE FOR CONDUCTING SAMPLES RESEARCHING Constructional peculiarities and technical characteristics of original vacuum scanning tunnel microscope UnderSEM-377, combined with commercial raster electronic microscope (JSM-T20) are described in this article. The possibility of topography research of surface and structure of electronic condition densities with lateral resolution ~1 nm is shown for constructed combine on the example of test samples corresponding fullerite tapes and organic semiconductor – 1,4,5,8 naphthalene tetracarboxil of dianhydride.
About this article
Author:
Year: 2007
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Editor-in-chief |
Sergey Aleksandrovich
MIROSHNIKOV |
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