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2014, № 4 (165)



Bulyarskyi S.V., Zhukov A.V., Igoshina A.A. INFLUENCE THE ELECTRON-PHONON INTERACTION ON THE PROBABILITY OF EMISSION OF CHARGE CARRIERS WITH DEEP LEVELSWe obtain an expression for the probability of transition from the recombination center with electron-phonon interaction. It is shown that with increasing heat, which determines the variance form functions to the transition probability increases rapidly. This can lead to high values of reverse current semiconductor structures in the space charge which contain vacancy-impurity complexes.Key words: deep levels, recombination, electron-phonon interaction, the probability of transition, thermal emission.

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About this article

Authors: Bulyarskiy S.V., Zhukov A.V., Igoshina A.A.

Year: 2014


Editor-in-chief
Sergey Aleksandrovich
MIROSHNIKOV

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